12.1 - TESTINGOFCOMBINATIONALLOGICCIRCUITS...

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  1 TESTING OF COMBINATIONAL LOGIC CIRCUITS DIGITAL LOGIC CIRCUIT TESTING DEFINITIONS TYPICAL DIGITAL CIRCUIT TEST SETUP FAULT MODELS COMBINATIONAL LOGIC CIRCUITS TEST GENERATION EXCLUSIVE-OR METHOD PATH-SENSITIZING METHOD PATH-SESITIZING IN POPULAR GATES  PATH-SESITIZING IN A NETWORK A NETWORK WITH FAN-OUT COUNTER-EXAMPLE TO SINGLE-PATH SENSITIZING UNTESTABLE FAULTS MULTIPLE OUTPUT NETWORKS FAULT DETECTION TEST SETS (FDTS) FAULT TABLE REDUCTION –  CHECK POINTS MINIMUM FDTS ____________________________________________________________________ ECSE-323/Department of Electrical and Computer Engineering/McGill University/ Prof. Marin. , by Nelson, Nagle, Carroll,  Irwin, Prentice-Hall,1995, Chapter 12, pages 739 to 757
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  2 TESTING OF COMBINATIONAL LOGIC CIRCUITS DIGITAL LOGIC CIRCUIT TESTING DEFINITIONS
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  3 TESTING OF COMBINATIONAL LOGIC CIRCUITS DIGITAL LOGIC CIRCUIT TESTING DEFINITIONS (CONTINUES)
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  4 TESTING OF COMBINATIONAL LOGIC CIRCUITS DIGITAL LOGIC CIRCUIT TESTING TYPICAL DIGITAL CIRCUIT TEST SETUP
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  5 TESTING OF COMBINATIONAL LOGIC CIRCUITS DIGITAL LOGIC CIRCUIT TESTING TYPICAL DIGITAL CIRCUIT TEST SETUP
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  6 TESTING OF COMBINATIONAL LOGIC CIRCUITS FAULT MODELS
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  7 TESTING OF COMBINATIONAL LOGIC CIRCUITS FAULT MODELS
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  8 TESTING OF COMBINATIONAL LOGIC CIRCUITS FAULT MODELS (CONTINUES) Example: Consider the following circuit which has a stuck-at- zero at wire  3 ,
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  9 TESTING OF COMBINATIONAL LOGIC CIRCUITS FAULT MODELS (CONTINUES)
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This note was uploaded on 01/27/2011 for the course ECSE 323 taught by Professor Rk during the Spring '10 term at McGill.

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12.1 - TESTINGOFCOMBINATIONALLOGICCIRCUITS...

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