13.1 - 1 ECSE-323 Digital System Design Sequential Testing...

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1 McGill University ECSE-323 Digital System Design / Prof. J. Clark ECSE-323 Digital System Design Sequential Testing Lecture #1
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2 McGill University ECSE-323 Digital System Design / Prof. J. Clark Why test? It's all about money ! $$$
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3 McGill University ECSE-323 Digital System Design / Prof. J. Clark Economics of testing We should test whenever: Cost of testing < Cost of not testing or, in terms of the Benefit-Cost ratio: Benefits of testing/Cost of testing > 1
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4 McGill University ECSE-323 Digital System Design / Prof. J. Clark Some costs of testing: fixed costs • test system hardware • factory space • test vector generation (done once) variable costs • operator salaries • hardware maintenance • electricity costs Costs increase with circuit speed and complexity
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5 McGill University ECSE-323 Digital System Design / Prof. J. Clark Some costs of not testing: system maintenance system downtime lawsuits longer time-to-market loss of market share Costs of not-testing increase rapidly as the point of failure moves to higher levels in the system hierarchy (e.g. chip - pcboard - computer - local power controller - national power grid)
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6 McGill University ECSE-323 Digital System Design / Prof. J. Clark (From the Texas Instruments IEEE std. 1149.1 (JTAG) Testability Primer)
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7 McGill University ECSE-323 Digital System Design / Prof. J. Clark ADVANTEST Model T6682 ATE
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8 McGill University ECSE-323 Digital System Design / Prof. J. Clark • 0.5-1.0GHz, 1024 digital pins: ATE purchase price = $1.2M + 1,024 pins x $3,000/pin = $4.272M • Running cost (five-year linear depreciation) = Depreciation + Maintenance + Operation = $0.854M + $0.085M + $0.5M = $1.439M/year • Test cost (24 hour ATE operation) = $1.439M/(365 x 24 x 3,600) = 4.5 cents/second Some typical testing costs (as of 2000)
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9 McGill University ECSE-323 Digital System Design / Prof. J. Clark Verification testing , characterization testing , or design debug Verifies correctness of design and of test procedure – usually requires correction to design Manufacturing testing Factory testing of all manufactured chips for parametric faults and for random defects Acceptance testing ( incoming inspection ) User (customer) tests purchased parts to ensure quality Types of Testing Procedures
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