Lecture 9 Noise and drift Spr2010

Lecture 9 Noise and drift Spr2010 - Noise and Drift Noise...

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oise and Drift Noise and Drift • Noise sources • Noise Characterization • Noise abatement • Signal recovery Spring 2010 Mat 288S Optoelectronic Measurements 1
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oise Sources Noise Sources Thermal noise: dB B th Tf k I 3 4 = Shot noise: shunt R dB d p shot f I I q I 3 ) ( 2 + = Thermally ionized traps, miscellaneous effects 1/f noise: Readout noise: Electronic circuitry associated with arrays terference: MI: power line harmonics, radio and Interference: hermal drift: Amplifier gain depends on temperature EMI: power line harmonics, radio and microwaves, digital and power switching noise Spring 2010 MAT 288S Optoelectronic Measurements 2 Thermal drift:
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ime Domain Characterization Time Domain Characterization de Amplitu d mean Time • Peak-to-peak deviation: V max -V min 2 / 1 • Root-mean-square (rms) deviation: pecify time period of measurement ( ) 2 ) ( 1 dt V t V T mean Spring 2010 Mat 288S Optoelectronic Measurements 3 Specify time period of measurement
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ignal Averaging Signal Averaging ut SNR samples of Number = in out SNR • Time-integrated signal: what “DC” instruments measure • Example: Optical power meters with adjustable integration time • Drift in experiment limits amount of averaging possible mbient temperature drift, sample degradation…) (ambient temperature drift, sample degradation…) Spring 2010 Mat 288S Optoelectronic Measurements 4
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hot Noise Limited SNR Shot Noise Limited SNR integration time Example 1E-9 BER requires SNR ~ 10 i t t i t i ( 1 b i 1 i ht t Spring 2010 Mat 288S Optoelectronic Measurements 5 1 ns integration time (1 Gbps) requires 1 microamp photocurrent
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This note was uploaded on 02/02/2011 for the course ECE 227A taught by Professor Coldren during the Spring '08 term at UCSB.

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Lecture 9 Noise and drift Spr2010 - Noise and Drift Noise...

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