Lecture2-Metrics

Lecture2-Metrics - EE141 EE141 EECS141 Lecture#2 1...

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EE141 1 EE141 EECS141 1 Lecture #2 EE141 EECS141 2 Lecture #2 Discussions start next week Labs start in week 3 Homework #1 is due next Friday Everyone should have an EECS instructional account Use cory, quasar, pulsar
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EE141 2 EE141 EECS141 3 Lecture #2 CMOS LEAKAGE CHARACTERIZATION X1 0 1 nvdd1 INVERTER X2 nvdd 2 nvdd2 INVERTER VDDS nvdd 0 1.2 VDDN nvdd nvdd1 0 VDDP nvdd nvdd2 0 .subckt INVERTER nin nout nsupply X1 nout nin 0 0 nsvt W=0.15 L=0.1 X2 nout nin nsupply nsupply psvt W=0.3 L=0.1 .ends INVERTER * Commands .dc VDDS 0.6 1.2 0.05 .print i(VDDN), i(VDDP) .options brief .lib '. .\. .\Models\65nmCMOS.lib' svt_TT .END Born in the days of punched cards EE141 EECS141 4 Lecture #2 Last lecture Introduction, Moore’s law, future of ICs Today’s lecture Introduces basic metrics for design of integrated circuits How to measure cost? Intro to IC manufacturing
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EE141 3 EE141 EECS141 5 Lecture #2 How to evaluate performance of a digital circuit (gate, block, …)? Cost Reliability Speed/Performance (delay, frequency) Power EE141 EECS141 6 Lecture #2 NRE (non-recurrent engineering) costs - fixed Independent of volume (i.e., number of units made/sold) Examples: design time and effort, mask generation, equipment, etc. Recurrent costs - variable proportional to volume Examples: silicon processing, packaging, test Most of these proportional to chip area
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EE141 4 EE141 EECS141 7 Lecture #2 EE141 EECS141 8 Lecture #2 8 Polysilicon Aluminum
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EE141 5 EE141 EECS141 9 Lecture #2 The image cannot be displayed. Your computer may not have enough memory to The image cannot be displayed. Your
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This note was uploaded on 02/06/2011 for the course EE 141 taught by Professor Staff during the Spring '08 term at Berkeley.

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Lecture2-Metrics - EE141 EE141 EECS141 Lecture#2 1...

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