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20091ee141_1_Project - EE 141 Project Winter 2009 Due...

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EE 141 – Project Winter 2009 Due: 03/18/2008 Atomic force microscopes provide a window into the world of nano-particles and nano-structures. By moving a cantilevered tip across the surface of a nano-structure, the tip is subjected to van der Waals attraction and repulsion forces between the atoms of the tip and the atoms of the surface being scanned. The motion of the tip can be recorded by shining a laser on the back of the cantilever and measuring its deflection. Deflection information is then used to construct a 3-dimensional map of the scanned surface. Atomic force microscopes have two different modes of operation. In the contact mode, the tip maintains a fixed distance to the surface while in tapping mode the tip performs an oscillatory motion. In both modes the amount of deflection of the probe is controlled by a feedback loop that we wish to design in this project. R Nano-structure x Figure 1: Cantilever model for atomic force microscopy.
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