Lect9Part5_EE529_429

Lect9Part5_EE529_429 - EE 429 EE 529 Introduction to EMC University at Buffalo Dr James J Whalen Lecture 36 Friday IEEE EMC Society Student Design

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Introduction to EMC University at Buffalo Dr. James J. Whalen Lecture 36 Friday November 14, 2008 IEEE EMC Society Student Design Contest 1. FCC Conducted Emission Limits for Class B Devices 2. MIL-STD-461 E CE102 Conducted Emission Limits 3. MIL-STD-461CE CE03 Conducted Emission Limits 4. FCC Rules Regulations: Title 47-Part 15-Subpart B from "Power Electronics Handbook" by M. H. Rashid 5. Calibration of Tektronix P6016 Current Probe
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TABLE 2.1 FCC andClSPR 22 Conducted Emission Limits for Class B Digital Devices Frequency (MHz) IJ. .V QP (A V) dBIJ. .V QP (A V) 0.15 0.5 0.5-5 5-30 1995 (631) 631 (199.5) 631 (199.5) 1000 (J 16) 66 (56) 56 (46) 56 (46) 60 (SO) 54 EMC REQUIREMENTS FOR ELECTRONIC SYSTEMS Measured with lISN (OP) > I ::l. I CD ~ , «> I 01 s ., 0 > 46 I (AV) I , , I f I 5 MHz 30 MHz 150 kHz I eJ 1 500 kHz 2nd (a)
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70 EMC REQUIREMENTS FOR ELECTRONIC SYSTEMS Product under test LlSN r--- I Ip I I Phase L, p C, I p L, N I I I r-- I I I + I I :: I R, Vp SOOI I I 1 1 I I ~ __ ~~~~~ ~~~~+-~~~ I L _ I I~ I ac . I power net I I I I I I I -.J GW Neutral FIG U RE 2.1 o The line impedance stabilization network (LISN) for the measurement of conducted emissions. ~ ---- 1 I p = -Vp 50 1 IN = -VN 50 Green wire 2.1 GOVERNMEN To EUTr-i-----~----~~~----~------4_~ To 50-11radio noise meter or 50-11 termination 50llH To powe sourc, _ 0.1 IlF 1000Q (a)
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To power >---~-- ~~~rv1r~ __-. ~ __~ source To 50 n terminat or 50 n input of ---- measurement receiver 50 J.l.H ToEUT FIGURE 2.11 LISN element values for (a) ~CC aRd CISPR ;U tlftd (b) MIL-STD-4.----- conducted emission tests. f 1 HL.-"5' f}-461 f? Signal output port 50 1kO (b) 64 EMC REQUIREMENTS FOR ELECTRONIC SYSTEMS I I I III I I I I I f I- Nominal EUT Limit source voltage relaxation 28 V· Basic curve ~ 115 V 6 dB 220 V 9 dB 270 V 10 dB " I 440 V 12 dB t-, - r- ~ I""\r--, r-. i- r-, <, i- ~ t-, " Basic curve i- i- ~ f': 100 94 90 .... ·E 70 :.:i 60 50 10k 100k 1M 10M 100M FIGURE 2.5 MIL-STD-461E CE102limit (EUT power leads, ac and de) for all applications [5]. 2 n _ . d..
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56 EMC REQUIREMENTS FOR ELECTRONIC SYSTEMS 20 dBJ. .lA Class A CE03 f 14 kHz 2 MHz 50 MHz AGURE 2.8· The MIL-STD-461 CE03 conducted emission limit for Class A equipment. Device Spectrum analyzer Power cord <, Current probe AGURE 2.9 Use of a current probe to verify the MIL-STD-461 conducted emission limits. ----W.ed, l!liL~ S]~~.6~/C --------
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40 EM! Effects of Power Converters 40.7 EMC Standards The number of institutions involved in regulations and rec- ommendations that concern EMI is quite large, and to an average person the issue of EMC standards can be some- what confusing. EMC is defined as the ability of equipment to function satisfactorily in its electromagnetic environment without introducing intolerable disturbances to anything in that environment. EMC requirements entail two major items: emissions and susceptibility, or its opposition, the immu- nity. Electromagnetic disturbance is any phenomenon
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This note was uploaded on 02/22/2011 for the course EE 529 taught by Professor Dr.j.j.whalen during the Fall '10 term at SUNY Buffalo.

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Lect9Part5_EE529_429 - EE 429 EE 529 Introduction to EMC University at Buffalo Dr James J Whalen Lecture 36 Friday IEEE EMC Society Student Design

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