EMS162_2011_Lecture16

EMS162_2011_Lecture16 - Temperature Dependent Measurements...

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Yayoi Takamura 2/24/2011 EMS 162 - Winter 2011 81 Temperature Dependent Measurements • Material with orthorhombic crystal structure between 0K and 300K Yayoi Takamura 2/24/2011 EMS 162 - Winter 2011 82 Temperature Dependent Measurements • Determined the anisotropy linear thermal expansion along the three crystallographic directions
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Yayoi Takamura 2/24/2011 EMS 162 - Winter 2011 83 Phase Transformations
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1 2/24/2011 Thin Film Diffraction 1 Yayoi Takamura Crystalline Quality of Thin Films Amorphous thin film – Thin film with short range order but no long range order. – Often formed after low temperature growth process and/or with a large mismatch between film and substrate material, or on an amorphous substrate. Polycrystalline thin film – Thin film composed of small crystalline regions which are completely randomly oriented. – Often formed after a moderate temperature growth process and/or small to moderate mismatch between film and substrate. Textured thin film – Crystalline grains have a preferential orientation in the (a) out-of-plane directions, but not in the (b) in-plane direction. Epitaxial thin film – Single crystal film in perfect registry with underlying single crystal substrate – Often requires a high temperature growth process and a
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This note was uploaded on 04/04/2011 for the course EMS 162 taught by Professor Howitt during the Spring '08 term at UC Davis.

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EMS162_2011_Lecture16 - Temperature Dependent Measurements...

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