{[ promptMessage ]}

Bookmark it

{[ promptMessage ]}

9_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

9_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

Info iconThis preview shows page 1. Sign up to view the full content.

View Full Document Right Arrow Icon
viii Contents 1.5 Historical Review of VLSI Test Technology . . . . . . . . . . . . . . . 25 1.5.1 Automatic Test Equipment . . . . . . . . . . . . . . . . . . . . 25 1.5.2 Automatic Test Pattern Generation . . . . . . . . . . . . . . . 27 1.5.3 Fault Simulation . . . . . . . . . . . . . . . . . . . . . . . . . . 28 1.5.4 Digital Circuit Testing . . . . . . . . . . . . . . . . . . . . . . 28 1.5.5 Analog and Mixed-Signal Circuit Testing . . . . . . . . . . . 29 1.5.6 Design for Testability . . . . . . . . . . . . . . . . . . . . . . . 29 1.5.7 Board Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 1.5.8 Boundary Scan Testing . . . . . . . . . . . . . . . . . . . . . . 32 1.6 Concluding Remarks . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 1.7 Exercises . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Acknowledgments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 2 Design for Testability 37 Laung-Terng (L.-T.) Wang, Xiaoqing Wen, and Khader S. Abdel-Hafez 2.1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 2.2 Testability Analysis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 2.2.1 SCOAP Testability Analysis . . . . . . . . . . . . . . . . . . . 41 2.2.1.1 Combinational Controllability and Observability Calculation . . . . . . . . . . . . . . . 41 2.2.1.2 Sequential Controllability and Observability Calculation . . . . . . . . . . . . . . . 43 2.2.2 Probability-Based Testability Analysis . . . . . . . . . . . . . 45 2.2.3 Simulation-Based Testability Analysis
Background image of page 1
This is the end of the preview. Sign up to access the rest of the document.
  • Spring '08
  • elbarki
  • Prime number, Automatic test pattern generation, testability analysis, Scan Cell Designs, Simulation-Based Testability Analysis, RTL Testability Analysis

{[ snackBarMessage ]}