15_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

15_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

Info iconThis preview shows page 1. Sign up to view the full content.

View Full Document Right Arrow Icon
xiv Contents 6 Test Compression 341 Xiaowei Li, Kuen-Jong Lee, and Nur A. Touba 6.1 Introduction . ................................ 342 6.2 Test Stimulus Compression . ....................... 344 6.2.1 Code-Based Schemes. ...................... 345 6.2.1.1 Dictionary Code (Fixed-to-Fixed). ......... 345 6.2.1.2 Huffman Code (Fixed-to-Variable) . ........ 346 6.2.1.3 Run-Length Code (Variable-to-Fixed) . ...... 349 6.2.1.4 Golomb Code (Variable-to-Variable) . ....... 350 6.2.2 Linear-Decompression-Based Schemes . ........... 351 6.2.2.1 Combinational Linear Decompressors. ...... 355 6.2.2.2 Fixed-Length Sequential Linear Decompressors . ............... 355 6.2.2.3 Variable-Length Sequential Linear Decompressors . ............... 356 6.2.2.4 Combined Linear and Nonlinear Decompressors . ............. 357 6.2.3 Broadcast-Scan-Based Schemes. ................ 359
Background image of page 1
This is the end of the preview. Sign up to access the rest of the document.
Ask a homework question - tutors are online