19_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

19_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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xviii Contents 11.1.1.2 Large Range of Circuits . ............. 621 11.1.1.3 Nonlinear Characteristics . ............ 621 11.1.1.4 Feedback Ambiguity . ............... 622 11.1.1.5 Complicated Cause–Effect Relationship. ....622 11.1.1.6 Absence of Suitable Fault Model . ........ 622 11.1.1.7 Requirement for Accurate Instruments for Measuring Analog Signals . ............ 623 11.1.2 Analog Defect Mechanisms and Fault Models. ....... 623 11.1.2.1 Hard Faults. ..................... 625 11.1.2.2 Soft Faults . ..................... 625 11.2 Analog Circuit Testing . ......................... 627 11.2.1 Analog Test Approaches . ................... 627 11.2.2 Analog Test Waveforms. .................... 629 11.2.3 DC Parametric Testing . .................... 631 11.2.3.1 Open-Loop Gain Measurement . ......... 632
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This note was uploaded on 05/16/2011 for the course ENGINEERIN mp108 taught by Professor Elbarki during the Spring '08 term at Alexandria University.

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