xviii
Contents
11.1.1.2
Large Range of Circuits
. . . . . . . . . . . . . .
621
11.1.1.3
Nonlinear Characteristics
. . . . . . . . . . . . .
621
11.1.1.4
Feedback Ambiguity
. . . . . . . . . . . . . . . .
622
11.1.1.5
Complicated Cause–Effect Relationship
. . . . .
622
11.1.1.6
Absence of Suitable Fault Model
. . . . . . . . .
622
11.1.1.7
Requirement for Accurate Instruments for
Measuring Analog Signals
. . . . . . . . . . . . .
623
11.1.2
Analog Defect Mechanisms and Fault Models
. . . . . . . .
623
11.1.2.1
Hard Faults
. . . . . . . . . . . . . . . . . . . . . .
625
11.1.2.2
Soft Faults
. . . . . . . . . . . . . . . . . . . . . .
625
11.2
Analog Circuit Testing
. . . . . . . . . . . . . . . . . . . . . . . . . .
627
11.2.1
Analog Test Approaches
. . . . . . . . . . . . . . . . . . . .
627
11.2.2
Analog Test Waveforms
. . . . . . . . . . . . . . . . . . . . .
629
11.2.3
DC Parametric Testing
. . . . . . . . . . . . . . . . . . . . .
631
11.2.3.1
Open-Loop Gain Measurement
. . . . . . . . . .
632
11.2.3.2
Unit Gain Bandwidth Measurement
. . . . . . .
633
11.2.3.3
Common Mode Rejection Ratio Measurement
. 634
11.2.3.4
Power Supply Rejection Ratio Measurement
. . 635
11.2.4
AC Parametric Testing
. . . . . . . . . . . . . . . . . . . . .
635
11.2.4.1
Maximal Output Amplitude Measurement
. . . .
636
11.2.4.2
Frequency Response Measurement
. . . . . . . .
637
11.2.4.3
SNR and Distortion Measurement
. . . . . . . .
639
11.2.4.4
Intermodulation Distortion Measurement
. . . .
641
11.3
Mixed-Signal Testing
. . . . . . . . . . . . . . . . . . . . . . . . . . .
641
11.3.1
Introduction to Analog–Digital Conversion
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- Spring '08
- elbarki
- Operational Amplifier, Electronics terms, Common-mode rejection ratio, Electronic design, ADC Circuit Structure
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