20_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

20_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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Contents xix 11.4.4 IEEE 1149.4 Test Modes. ................... 666 11.4.4.1 Open/Short Interconnect Testing. ........ 666 11.4.4.2 Extended Interconnect Measurement . ..... 667 11.4.4.3 Complex Network Measurement . ........ 671 11.4.4.4 High-Performance Configuration. ........ 672 11.5 Concluding Remarks . .......................... 673 11.6 Exercises. ................................. 673 Acknowledgments. ................................ 676 References. .................................... 677 12 Test Technology Trends in the Nanometer Age 679 Kwang-Ting (Tim) Cheng, Wen-Ben Jone, and Laung-Terng (L.-T.) Wang 12.1 Test Technology Roadmap. ....................... 680 12.2 Delay Testing . .............................. 685 12.2.1 Test Application Schemes for Testing Delay Defects. ...686
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