21_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

21_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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xx Contents 12.6 High-speed I/O Testing. ......................... 719 12.6.1 I/O Interface Technology and Trend . ............ 720 12.6.2 I/O Testing and Challenges. .................. 724 12.6.3 High-Performance I/O Test Solutions . ........... 725 12.6.4 Future Challenges. ....................... 726 12.7 RF Testing . ................................ 728 12.7.1 Core RF Building Blocks. ................... 729 12.7.2 RF Test Specifications and Measurement Procedures . . . 730 12.7.2.1 Gain. ......................... 730 12.7.2.2 Conversion Gain. .................. 731 12.7.2.3 Third-Order Intercept. ...............
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Unformatted text preview: 731 12.7.2.4 Noise Figure . . . . . . . . . . . . . . . . . . . . . 733 12.7.3 Tests for System-Level Specifications . . . . . . . . . . . . 733 12.7.3.1 Adjacent Channel Power Ratio . . . . . . . . . . 733 12.7.3.2 Error Vector Magnitude, Magnitude Error, and Phase Error . . . . . . . . . . . . . . . . . . . . . 734 12.7.4 Current and Future Trends . . . . . . . . . . . . . . . . . . 735 12.7.4.1 Future Trends . . . . . . . . . . . . . . . . . . . . 736 12.8 Concluding Remarks . . . . . . . . . . . . . . . . . . . . . . . . . . . 737 Acknowledgments . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 738 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 738 Index 751...
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This note was uploaded on 05/16/2011 for the course ENGINEERIN mp108 taught by Professor Elbarki during the Spring '08 term at Alexandria University.

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