26_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

26_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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A CKNOWLEDGMENTS The editors would like to acknowledge many of their colleagues who helped create this book. First and foremost are the 27 chapter/section contributors listed in the following section. Without their strong commitments to contributing the chapters and sections of their specialties to the book in a timely manner, it would not have been possible to publish this fundamental DFT textbook, which covers the most recent advances in VLSI testing and DFT architectures. We also would like to give additional thanks to the reviewers of the book, partic- ularly Prof. Fa Foster Dai (Auburn University), Prof. Andre Ivanov (University of British Columbia, Canada), Prof. Chong-Min Kyung (Korea Advanced Institute of Science and Technology, Korea), Prof. Adam Osseiran (Edith Cowan University, Australia), Prof. Sudhakar M. Reddy (University of Iowa), Prof. Michel Renovell (LIRMM, France), Prof. Kewal K. Saluja (University of Wisconsin–Madison), Prof. Masaru Sanada (Kochi University of Technology, Japan), Prof. Hans-Joachim
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This note was uploaded on 05/16/2011 for the course ENGINEERIN mp108 taught by Professor Elbarki during the Spring '08 term at Alexandria University.

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