28_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

28_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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C ONTRIBUTORS Khader S. Abdel-Hafez , Director of Engineering (Chapter 2) SynTest Technologies, Inc., Sunnyvale, California Soumendu Bhattacharya , Post-Doctoral Fellow (Chapter 12) School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia Abhijit Chatterjee , Professor (Chapter 12) School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia Xinghao Chen , Associate Professor (Chapter 2) Department of Electrical Engineering, The Grove School of Engineering, City College and Graduate Center of The City University of New York, New York Kwang-Ting (Tim) Cheng , Chair and Professor, IEEE Fellow (Chapter 12) Department of Electrical and Computer Engineering, University of California, Santa Barbara, California William Eklow , Distinguished Manufacturing Engineer (Chapter 10)
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Unformatted text preview: Cisco Systems, Inc., San Jose, California; Chair, IEEE 1149.6 Standard Committee Michael S. Hsiao , Associate Professor and Dean’s Faculty Fellow (Chapter 4) Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, Virginia Jiun-Lang Huang , Assistant Professor (Chapter 3) Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan Shi-Yu Huang , Associate Professor (Chapter 7) Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan Wen-Ben Jone , Associate Professor (Chapter 12) Department of Electrical & Computer Engineering and Computer Science, University of Cincinnati, Cincinnati, Ohio Rohit Kapur , Scientist, IEEE Fellow (Chapter 6) Synopsys, Inc., Mountain View, California...
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