30_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

30_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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A BOUT THE E DITORS Laung-Terng (L.-T.) Wang, Ph.D., founder and chief executive officer (CEO) of SynTest Technologies (Sunnyvale, CA), received his BSEE and MSEE degrees from National Taiwan University in 1975 and 1977, respectively, and his MSEE and EE Ph.D. degrees under the Honors Cooperative Program (HCP) from Stanford University in 1982 and 1987, respectively. He worked at Intel (Santa Clara, CA) and Daisy Systems (Mountain View, CA) from 1980 to 1986 and was with the Department of Electrical Engineering of Stanford University as Research Associate and Lecturer from 1987 to 1991. Encouraged by his advisor, Professor Edward J. McCluskey, a member of the National Academy of Engineering, he founded Syn- Test Technologies in 1990. Under his leadership, the company has grown to more than 50 employees and 250 customers worldwide. The design for testability (DFT) technologies Dr. Wang has developed have been successfully implemented in thou- sands of ASIC designs worldwide. He has filed more than 25 U.S. and European
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  • Spring '08
  • elbarki
  • Tsinghua University, Academic degree, People's Republic of China, National Tsing Hua University, National Taiwan University

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