66_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

66_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

Info iconThis preview shows page 1. Sign up to view the full content.

View Full Document Right Arrow Icon
Introduction 35 [Breuer 1987] M. A. Breuer and A. D. Friedman, Diagnosis and Reliable Design of Digital Systems , Computer Science Press, 1987 (revised printing). [Bushnell 2000] M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits , Springer Science, New York, 2000. [Jha 2003] N. K. Jha and S. K. Gupta, Testing of Digital Systems , Cambridge University Press, Cambridge, U.K., 2003. [McCluskey 1986] E. J. McCluskey, Logic Design Principles with Emphasis on Testable Semi- custom Circuits , Prentice Hall, Englewood Cliffs, NJ, 1986. [Min 1986] Y. Min, Logical Circuit Testing (in Chinese), China Railway Publishing House, Beijing, China, 1986. [Mourad 2000] S. Mourad and Y. Zorian, Principles of Testing Electronic Systems , John Wiley [Parker 2001] K. P. Parker, The Boundary-Scan Handbook , Kluwer Academic, Norwell, MA, 2001. [Stroud 2002] C. E. Stroud,
Background image of page 1
This is the end of the preview. Sign up to access the rest of the document.

This note was uploaded on 05/16/2011 for the course ENGINEERIN mp108 taught by Professor Elbarki during the Spring '08 term at Alexandria University.

Ask a homework question - tutors are online