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100_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

100_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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Design for Testability 69 D Q RE SD SD (a) SC PI PO SC SC SC SC SC SC SC SC CA Column line drivers Row enable shift register Column address decoder Test control logic Sense-amplifiers & MISR TM SI/SO CK Combinational logic (b) for each test vector v i ( i = 1, 2, ··· , N ) { / * Test stimulus application * / / * Test response compression * / enable TM ; for each row r j ( j = 1, 2, ··· , m ) { read all scan cells in r j / update MISR; for each scan cell SC in r j / * v (SC): current value of SC
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