100_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

100_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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Design for Testability 69 DQ RE SD SD (a) SC PI PO SC SC SC SC SC SC SC SC CA Column line drivers Row enable shift register Column address decoder Test control logic Sense-amplifiers & MISR TM SI/SO CK Combinational logic (b) for each test vector v i ( i = 1, 2, ··· , N ) { / * Test stimulus application * / / * Test response compression * / enable TM ; for each row r j ( j = 1, 2, ··· , m ) { read all scan cells in r j / update MISR; for each scan cell SC in r j / * v (SC): current value of SC
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This note was uploaded on 05/16/2011 for the course ENGINEERIN mp108 taught by Professor Elbarki during the Spring '08 term at Alexandria University.

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