{[ promptMessage ]}

Bookmark it

{[ promptMessage ]}



Info iconThis preview shows page 1. Sign up to view the full content.

View Full Document Right Arrow Icon
90 VLSI Test Principles and Architectures observability at nonstorage circuit nodes can be dramatically improved. Hence, the scan-set technique can significantly improve the circuit’s diagnostic resolution and silicon debug capability. These advantages have made the approach attractive to high-performance and high-complexity designs [Kuppuswamy 2004], despite the increased area overhead. The technique has also been extended to the LSSD architecture [DasGupta 1981]. 2.8.3 Error-Resilient Scan Soft errors are transient single-event upsets (SEUs) caused by various types of radiation. Cosmic radiation has long been regarded as the major source of soft errors, especially in memories [May 1979], and chips used in space applications typically use parity or error-correcting code (ECC) for soft error protection. As circuit features begin to shrink into the nanometer ranges, error-causing activa- tion energies are reduced. As a result, terrestrial radiation, such as alpha particles
Background image of page 1
This is the end of the preview. Sign up to access the rest of the document.

{[ snackBarMessage ]}

Ask a homework question - tutors are online