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Unformatted text preview: CLK is 1, the outputs of latches PH 2 and LA hold their previous logic values, and the logic values drive O 1 and O 2 , respectively. If a soft error occurs either at PH 2 or at LA , O 1 and O 2 will have different logic values. In both cases, unless such a soft error occurs after the correct logic value passes through the C-element and reaches the keeper, the soft error will not propagate to the output Q and the keeper will retain the correct logic value at Q . Error-resilient scan is one of the first online test techniques developed for soft error protection. While the error-resilient scan cell requires more test signals, clocks, and area overhead than conventional scan cells, the technique paves the way...
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This note was uploaded on 05/16/2011 for the course ENGINEERIN mp108 taught by Professor Elbarki during the Spring '08 term at Alexandria University.
- Spring '08