146VLSI Test Principles and ArchitecturesstartendendF ← collapsed fault listnononoyesyesyesnext pattern?more events?apply next patterndelete detected faultsfrom FFempty?1. analyze events at gate inputs2. execute events3. compute events at gate outputsFIGURE 3.33Concurrent fault simulation ﬂowchart.a bad gate diverges or converges depends on three factors: the visibility, the badevent, and the concurrent fault list (see [Abramovici 1994] for more details). Afterthe event execution, new events are computed at the gate output. If an event reachesthe primary outputs, detected faults can be removed from concurrent fault lists ofall gates. This process repeats until there are no more test patterns or no undetected
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