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Unformatted text preview: n ² ⊕ f±x 1 µx 2 µ· · · µ x i µ· · · µx n ² In terms of test generation, for any target fault on some fault ¸/v , the set of all vectors that can propagate the fault-effect to the primary output f is then those vectors that can satisfy: df d¸ = 1 (Note that this is independent of the polarity of the fault, whether it is stuck-at-0 or stuck-at-1.) Next, the constraint that the fault must be excited, ¸ set to value v , must be added. Subsequently, the set of test vectors that can detect the fault becomes all those input values that can satisfy the following equation: ±¸ = v² · df d¸ = 1 (4.2) Consider the same circuit shown in Figure 4.5 again. Suppose the target fault is w/ 0. The same analysis can be performed for this new fault. The set of test vectors that can detect w/ 0 is simply: w · df dw = 1 ⇒ w · ±f±w = 1 ² ⊕ f±w = ²² = 1...
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This note was uploaded on 05/16/2011 for the course ENGINEERIN mp108 taught by Professor Elbarki during the Spring '08 term at Alexandria University.
- Spring '08