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Unformatted text preview: in a circuit. They can be extremely helpful for the ATPG to make better decisions, reduce the number of backtracks, etc. Over the past few decades, logic implications have been applied and shown their effectiveness in several areas relevant to testing. They include test-pattern-generation [Schulz 1988] [El-Maleh 1998] [Tafertshofer 2000], logic and fault simulation [Kajihara 2004], fault diagnosis [Amyeen 1999], logic verification [Paul 2000] [Marques-Silva 1999a] [Arora 2004], logic optimiza-tion [Ichihara 1997] [Kunz 1997], and untestable fault identification [Iyer 1996a] [Iyer 1996b] [Peng 2000] [Hsiao 2002] [Syal 2004]....
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- Spring '08