Test Generation199DbClockaD01ClockabD01ClockabDabQQQQFIGURE 4.33Transformation of gated clock.Clock2Clock1baf(Clock1,Clock2)new anew bDQDQDQQDFIGURE 4.34Transformation of multiple clocks.Note, however, fault models other than the stuck-at model may not necessarilybenefit from this transformation.Finally, alternatives to the above MUX-based modifications are possible for han-dling designs with multiple clocks. They include the one-hot or the staggered clock-ing schemes. The details of the clocking are described in Section 5.7. One-hotclocking gives better fault coverage, but it suffers from potential large test sets.
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Automatic test pattern generation, combinational ATPG, staggered clocking schemes