232_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

232_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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Test Generation 201 approaches. FIRE [Iyer 1996a] is a technique to identify untestable faults based on conflict analysis. While the theory can be applicable to any conflicting scenario, only single-line conflicts were implemented in FIRE. The basic idea behind FIRE is very simple. Because it is impossible for a single line to take on both logic values 0 and 1 simultaneously, logic values 0 and 1 set on any signal would clearly be a conflicting scenario. Subsequently, any fault that requires a signal set to both logic values 0 and 1 for its detection would be untestable. In order to reduce the computational cost, FIRE restricts its search to only fanout stems instead of every gate in the circuit. In the single-line conflict analysis, for each gate in the circuit, the following two sets are computed: ± S 0 —Set of faults not detectable when signal g = 0. ± S 1 —Set of faults not detectable when signal g = 1. Essentially, all the faults in each set
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