Unformatted text preview: stage one, for example, fault samples may be used instead of simulating all faults. Also, counting the number of events in logic simulation may be used to estimate the number of faults excited; this may eliminate the high cost of fault simulation. When using such fitness estimates, one must be aware of the potential loss in the quality of the derived solution and that the final fault coverage may also be reduced. 188.8.131.52 CASE Studies In the GA-based ATPG by Srinivas and Patnaik [Srinivas 1993], combinational cir-cuits were targeted. Each individual represented a test vector. The fitness function accounted for excitation of the fault and propagation of the fault effect. Depending on the fitness of an individual, different crossover and mutation rates were used. While test sets were large, high coverages were obtained....
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- Patnaik, final fault coverage