Unformatted text preview: ded properties in the fault-free circuit that can help with the test generation process. For spectrum-based ATPG, the underlying sequential circuit is viewed as a black-box system that is identifiable and predictable from its input/output signals, rather than the traditional view as a netlist of primitives. In studying a signal, the foremost concern is the predictability of the signal. If the signal is predictable, then a portion of it can be used to represent and reconstruct its entirety. Testing of sequential systems, then, becomes a problem of constructing a set of waveforms which when applied at the primary inputs of the circuit can achieve high fault coverages by exciting and propagating many faults in the circuit....
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- Spring '08
- Space Exploration, The Circuit, Input/output, Automatic test pattern generation