257_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

257_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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226 VLSI Test Principles and Architectures In order to capture the spectral characteristics of a signal, a clean representation for that signal is desired (wider spectra lead to more unpredictable or random signals). Thus, any embedded noise should be filtered from the signal. In the context of test generation, static test set compaction can be viewed as a filter as it reduces the size of the test set by removing any unnecessary vectors while retaining the useful ones that achieve the same fault coverage as the original uncompacted test set. In other words, static test set compaction filters unwanted noise from the derived test vectors, leaving a cleaner signal (narrower spectrum) for analysis. Vectors that are generated from the narrow spectrum may have better fault detection characteristics. Frequency decomposition is the most commonly used technique in signal pro- cessing. A signal can be projected to a set of independent waveforms that have different frequencies. In the work by Giani
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