Test Generation229A fast run of a GA-based test generator is followed by a run of a deterministic testgenerator that targets faults that were left undetected by the previous GA-based testgenerator. Any successful sequences derived by the deterministic test generator areused as seeds for the successive GA-based ATPG run. The test sequences derived bythe deterministic engine typically will traverse previously unvisited states. Thus, thedeterministic test generator may be viewed as an external engine whose purposeis mainly to guide the GA to new state spaces of the circuit that have not beenvisited. By visiting new state spaces, the test generator can maximize the searchspace. Furthermore, the use of a deterministic test generator also helps to identifyany untestable faults, thus saving the computational effort in the GA runs on thosefaults that could never be detected.The test generation process in ALT-TEST is divided into three stages; each of
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U.S. state, stage, Spacecraft propulsion, Multistage rocket