Unformatted text preview: fault model. But, for small delay defects, an enhanced transition fault model is needed to properly address the aforementioned issues. Transition tests can also be applied in three different ways as for the other delay fault models discussed earlier: launch-on-capture , launch-on-shift , and enhanced-scan . As with path-delay tests, because both launch-on-capture and launch-on-shift place constraints on what the second vector can be, they will achieve lower transition fault coverage when compared with enhanced-scan....
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- Spring '08
- Gate, Automatic test pattern generation, Electronic design, transition fault, transition fault model