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272_pdfsam_VLSI TEST PRINCIPLES &amp; ARCHITECTURES

# 272_pdfsam_VLSI TEST PRINCIPLES &amp; ARCHITECTURES -...

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Test Generation 241 we can do the following: Apply each vector twice except for the first and the last vectors stored in the tester memory. Consider the sequence ±V 1 ²V 2 ²V 3 ²V 4 ²V 1 ²V 3 ²V 5 ³ . Because all but the first and the last vectors are applied twice, the set of transition test patterns we obtain would be ´V 1 ²V 2 µ , ´V 2 ²V 3 µ , ´V 3 ²V 4 µ , ´V 4 ²V 1 µ , ´V 1 ²V 3 µ , and ´V 3 ²V 5 µ . This set of patterns includes all the test patterns of Table 4.15, plus the additional ´V 4 ²V 1 µ . This example shows that 7 vectors (instead of 10 vectors) can be sufficient to apply all the needed transition tests. Such sequences where all but the first and the last vectors are applied twice are called transition test chains . 4.10.4.1 Transition Test Chains via Weighted Transition Graph Because transition faults and stuck-at faults are closely related, it may be possible to construct transition test sets directly from stuck-at test sets using the concept of transition test chains [Liu 2005]. A
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