273_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

273_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES - V...

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242 VLSI Test Principles and Architectures Algorithm 16 WeightedTransitionGraphConstruction( T ) Require: stuck-at test set T = ±T 1 ²²²T N ³ 1: Perform transition fault simulation using pairs of vectors T±´T 1 µT 2 ¶µ ´T 2 µT 3 ¶²²²´T N 1 µT N ¶³ ; 2: U T = the set of undetected transition faults; 3: U S =∅ ; 4: if transition fault X slow-to-rise (or slow-to-fall) U T then 5: U S = U S ±X/ 0 µX/ 1 ³ ; 6: end if 7: Perform stuck-at fault simulation without fault dropping using the stuck-at test set T on only the stuck-at faults in U S . 8: for each stuck-at fault f U S do 9: record the vectors in T that can excite f and the vectors that can detect f ; 10: end for 11: for each vector v T do 12: record the faults excited and detected by v ; 13: end for 14: for all vector pairs T i and T j do 15: Insert a directed edge from
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Unformatted text preview: V i to V j if test pattern ´T i µT j ¶ detects at least one transition fault in U T ; 16: weight of inserted directed edge = number of transition faults detected by ´T i µT j ¶ ; 17: end for TABLE 4.16 ± Fault Dictionary Without Fault Dropping Vectors Excited Faults Detected Faults V 1 a/ µb/ 1 µc/ 1 µd/ µe/ a/ µb/ 1 V 2 b/ 1 µc/ µd/ µe/ 1 c/ µd/ µe/ 1 V 3 a/ 1 µc/ 1, a/ 1 µc/ 1 V 4 a/ 1 µb/ µd/ 1 µe/ b/ µd/ 1 µe/ V 1 V 2 V 4 V 3 3 1 2 1 1 V 1 V 2 V 4 V 3 1 1 (b) Updated graph (a) Original graph 1 ± FIGURE 4.54 Weighted transition-pattern graph example....
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This note was uploaded on 05/16/2011 for the course ENGINEERIN mp108 taught by Professor Elbarki during the Spring '08 term at Alexandria University.

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