276_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

276_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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Test Generation 245 y y AND-bridge xx y y OR-bridge x x y y x DOM y x y y x DOM1 y x y y y x y x y x y x y y x y x y x y x y x DOM0 y Faulty-circuit model Fault-free circuit ± FIGURE 4.55 Bridging fault models. Feedback bridge a b c z ± FIGURE 4.56 A feedback bridging fault. Testing for bridging faults is similar to a constrained stuck-at ATPG. In other words, when testing for the AND-bridge
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