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280_pdfsam_VLSI TEST PRINCIPLES &amp; ARCHITECTURES

# 280_pdfsam_VLSI TEST PRINCIPLES &amp; ARCHITECTURES - a...

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Test Generation 249 faults is also covered, with emphasis on those fault models that address delay defects, such as the path-delay fault and the transition fault. Finally, additional topics are briefly addressed that relate to the topic of test generation. 4.13 EXERCISES 4.1 (Random Test Generation) Given a circuit with three primary outputs, x y , and z , the fanin cone of x is a b c , the fanin cone of y is c d e f , and the fanin cone of z is e f g . Devise a pseudo-exhaustive test set for this circuit. Is this test set the minimal pseudo-exhaustive test set? 4.2 (Random Test Generation) Using the circuit shown in Figure 4.10, compute the detection probabilities for each of the following faults:
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Unformatted text preview: a. e/ b. e/ 1 c. c/ 4.3 (Boolean Difference) Using the circuit shown in Figure 4.10, compute the set of all vectors that can detect each of the following faults using Boolean difference: a. e/ b. e/ 1 c. c/ 4.4 (Boolean Difference) Using the circuit shown in Figure 4.16, compute the set of all vectors that can detect each of the following faults using Boolean difference: a. a/ 1 b. d/ 1 c. g/ 1 4.5 (Boolean Difference) Using the circuit shown in Figure 4.35, compute the set of all vectors that can detect each of the following faults using Boolean difference: a. a/ 1 b. b 1 / 1 c. e/ d. e 2 / 1...
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