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Unformatted text preview: ally untestable is also sequentially untestable. 4.22 (FAN) Consider the circuit shown in Figure 4.19. Suppose the constraint that y = 1 → x = 0 is given. How could one use this knowledge to reduce the search space when trying to generate vectors in the circuit? For example, suppose the target fault is y/ 0. 4.23 (Sequential ATPG) Consider the circuit shown in Figure 4.60. The target fault is a/ 0. a. Generate a test sequence for the target fault using only 5-valued logic. b. Generate a test sequence for the target fault using 9-valued logic....
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- Spring '08