287_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES

287_pdfsam_VLSI TEST PRINCIPLES & ARCHITECTURES -...

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256 VLSI Test Principles and Architectures References R4.1—Introduction [Abramovici 1994] M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design , IEEE Press, Piscataway, NJ, 1994. [Bushnell 2000] M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits , Springer, New York, 2000. [Holland 1975] J. H. Holland, Adaptation in Natural and Artificial Systems , University of Michigan Press, Ann Arbor, MI, 1975. [Jha 2003] N. Jha and S. Gupta, Testing of Digital Systems , Cambridge University Press, Cambridge, U.K., 2003. R4.2—Random Test Generation [David 1976] R. David and G. Blanchet, About random fault detection of combinational networks, IEEE Trans. Comput. , C-25(6), 659–664, 1976. [Shedletsky 1977] J. J. Shedletsky, Random testing: practicality vs. verified effectiveness, in Proc. Int. Conf on Fault-Tolerant Computing , June 1977, pp. 175–179. R4.4—Designing a Stuck-At ATPG for Combinational Circuits
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