CHAPTER 5LOGICBUILT-INSELF-TESTLaung-Terng (L.-T.) WangSynTest Technologies, Inc., Sunnyvale, CaliforniaABOUT THIS CHAPTERLogicbuilt-in self-test(BIST) is adesign for testability(DFT) technique in whicha portion of a circuit on a chip, board, or system is used to test the digital logiccircuit itself. Logic BIST is crucial for many applications, in particular for life-critical and mission-critical applications. These applications commonly found inthe aerospace/defense, automotive, banking, computer, healthcare, networking, andtelecommunications industries require on-chip, on-board, or in-system self-test toimprove the reliability of the entire system, as well as the ability to perform remotediagnosis.This chapter first introduces the basic concepts and design rules of logic BIST.Next, we focus on a number of test pattern generation and output response anal-ysis techniques suitable for BIST implementations. Test pattern generation tech-
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