Logic Built-In Self-Test265for testing the functional circuitry at the system, board, or chip level to ensureproduct quality.Functional offline BISTperforms a test based on the functional specificationof the functional circuitry and often employs a functional or high-level fault model.Normally such a test is implemented as diagnostic software or firmware.Structural offline BISTperforms a test based on the structure of the functionalcircuitry. There are two general classes of structural offline BIST techniques: (1)external BIST, in which test pattern generation and output response analysis isdone by circuitry that is separate from the functional circuitry being tested, and (2)internal BIST, in which thefunctional storage elementsare converted into testpattern generators and output response analyzers. Some external BIST schemes testsequential logic directly by applying test patterns at the inputs and analyzing theresponses at its outputs. Such techniques are often used for board-level and system-
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Automatic test pattern generation, BIST, Test Card, structural offline BIST, BIST Controller, logic bist controller