01. Introduction

01. Introduction - EEE 536 Semiconductor Characterization...

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© D.K. Schroder, Semiconductor Characterization EEE 536 Semiconductor Characterization D.K. Schroder Arizona State University Tempe, AZ 85287
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© D.K. Schroder, Semiconductor Characterization Welcome Welcome to EEE536 Semiconductor Characterization . This is a most useful course if You are working with semiconductor materials or devices You are involved with measurements You are looking for a job (answer interview questions) It will give you a good overview of most of the characterization techniques in the semiconductor industry Electrical measurements Optical measurements Electron and ion beam measurements X-ray and probe measurements The prerequisite for this course is a previous course in semiconductor device physics, e.g ., ASU’s EEE 436 You should be familiar with the basic semiconductor devices: pn junctions, metal-semiconductor devices, and MOS devices
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Semiconductor Characterization Learning Objectives The objective of this course is an understanding of most of the characterization techniques used in the semiconductor industry The major emphasis will be on electrical characterization , since these characterization techniques are most frequently used However, optical techniques , as well as electron beam, ion beam , X-ray , and probe methods will also be discussed. Where necessary, device physics will be
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This note was uploaded on 05/25/2011 for the course EEE 536 taught by Professor Schroder during the Spring '11 term at ASU.

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01. Introduction - EEE 536 Semiconductor Characterization...

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