PHY2061 R. D. Field Department of Physics chp41_7.doc University of Florida Thin Film Interference Thin film interference occurs when a thin layer of material (thickness T) with index of refraction n2(the "film"layer) is sandwiched between two other mediums n1and n3.The overall lateral shiftbetween the reflected waves 1and 2is given by, ∆∆∆overallT=++212, where it is assumed that the incident light ray is nearly perpendicular to the surface and the lateral shifts ∆1and ∆2are given the table. Maximal Constructive Interference: The condition for maximal constructive
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This note was uploaded on 05/31/2011 for the course PHY 2061 taught by Professor Fry during the Spring '08 term at University of Florida.