chp41_7 - PHY2061 R. D. Field Thin Film Interference Thin...

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PHY2061 R. D. Field Department of Physics chp41_7.doc University of Florida Thin Film Interference Thin film interference occurs when a thin layer of material (thickness T ) with index of refraction n 2 (the "film" layer) is sandwiched between two other mediums n 1 and n 3 . The overall lateral shift between the reflected waves 1 and 2 is given by, ∆∆ overall T =+ + 2 12 , where it is assumed that the incident light ray is nearly perpendicular to the surface and the lateral shifts 1 and 2 are given the table. Maximal Constructive Interference: The condition for maximal constructive
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This note was uploaded on 05/31/2011 for the course PHY 2061 taught by Professor Fry during the Spring '08 term at University of Florida.

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