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73_Efield - 18 IEEE TRANSACTIONS ON ELECTRICAL INSULATION...

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IEEE TRANSACTIONS ON ELECTRICAL INSULATION, VOL. EI-9, NO. 1, MARCH 1974 [14] N. R. Mann, "Design of over-stress life-test experiments when failure times have the two-parameter Weibull distribution," Techno7netrics, vol. 14, pp. 437-451, 1972. [15] J. McCallum, R. E. Thomas, and J. H. Waite, "Accelerated testing of space batteries," National Aeronautics and Space Administration Rep. NASA SP-323. (For sale by the National Technical Information Service, Springfield, Va. 22151. Price $3.00.) [16] W. Mendenhall, "A bibliography of life testing and related topics," Biometrika, vol. 45, pp. 521-543, 1938. [17] W. B. Nelson, "Planning and statistical analysis of accelerated life tests Methods for complete data," General Electric Re- search and Development Center, Schenectady, N. Y., TIS Rep. 70-C-294, 1970;' W. B. Nelson, "Analysis of accelerated life test data-Part I: The Arrhenius model and graphical meth- ods," IEEE Trans. Elec. Insul., vol. EI-6, pp. 165-181, Dec. 1971; "Part II: Numerical methods and test planning," vol. EI-7, pp. 36-55, Mar. 1972: "Part III: Product comparisons and checks on the validity of the model and data," vol. EI-7, pp. 99-119, June 1972; "Table of contents for 'Analysis of accelerated life test data,' " vol. EI-7, pp. 158-159, Sept. 1972.1 [18] -, "Statistical methods for accelerated life test data The inverse power law model," General Electric Research and De- velopment Center, Schenectady, N. Y., TIS Rep. 71-C-011, 1970;1 also in "Graphical analysis of accelerated life test data with the inverse power law model," IEEE Trans. Rel., vol. R-21, pp. 2-11, Feb. 1972. (Correction in IEEE Trans. Rel., vol. R-21, p. 195, Aug. 1972.)' [19] "Analysis of residuals from censored data with applica- tions to life and accelerated test data," General Electric Re- search and Development Center, Schenectady, N. Y., TIS Rep. 71-C-120, 1971;' also in Technometrics, vol. 15, Nov. 1973. [20] ', "Graphical analysis of accelerated life test data with different failure modes," General Electric Research and De- velopment Center, Schenectady, N. Y., TIS Rep. 73-CRD-001, 1973.1 [21] W. B. Nelson and G. J. Hahn, "Regression analysis for censored data Linear estimation using ordered observations," General Electric Research and Development Center, Schenectady, N. Y., TIS Rep. 71-C-122, 1971;' also in "Part I: Simple meth- ods and their application," Technometrics, vol. 14, pp. 247-269, May 1972; "Part II: Best linear unbiased estimation and theory," vol. 14, pp. 133-150, Feb. 1973. [22a] W. B. Nelson and R. Hendrickson, "1972 user manual for STATPAC A general purpose program for data analysis and for fitting statistical models to data," General Electric Re- search and Development Center, Schenectady, N. Y., TIS Rep. 72-GEN-009, 1972.1 (A much shorter version of the manual is "STATPAC simplified," TIS Rep. 73-CRD-046).' [22b] W. B. Nelson and T. J. Kielpinski, "Optimum accelerated life tests for normal and lognormal life distributions," General Electric Research and Development Center, Schenectady, N. Y., TIS Rep. 72-CRD-215, 1972.' [23] D. S. Peck, "The analysis of data from accelerated stress tests," in Reliability Physics 9th Annu. Proc. 1971, 1971, pp.
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