SemiE_field - IEEE TRANSACTIONS ON INSTRUMENTATION AND...

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Unformatted text preview: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. IM-26, NO. 3, SEPTEMBER 1977 sufficientlysmallmeasurementerror(<0.5percentofthe reading).Itsprincipalareaofapplicationwillbemea- surements ofstandard currenttransformerswithhigh secondaryratedcurrents,theerrorsofwhichcanbede- finedforthefirsttimedirectlyandwithoutasecondary transformer.Therewillbenointerestinusingthemethod alsoforthedeterminingoferrorsofcommerciallyavailable measuringinstrumenttransformersasmeasurementson thesetransformerscaneasilyand,withadequateaccuracy, becarriedoutwiththeaidofthehithertoexistingtrans- formermeasuringdevices. REFERENCES [1]P.N.Miljanic,N.L.Kusters,andW.J.M.Moore,"Theapplication ofcurrentcomparatorstothecalibrationofcurrenttransformersat ratiosupto36000/5amperes,"IEEE Trans.Instrum.Meas.,vol. IM-17,pp.196-203,1968. [21 A.H.M.Arnold,"Current-transformertesting,"J.Inst.Elec.Eng., vol.74,pp.424-444,1934. [3] W. Hohle, "Eine tragbare Stromwandler-Prufeinrichtung hoher Genauigkeit,"Arch.Elektrotechnik,vol.27,p.849,1933. [41 Hartmannand Braun,Wandler- und Burdenme3einrichtung nach dem Differenzverfahren, Typ METH. [5] N.L.KustersandW.J.M. Moore,"The compensated currentcom- parator,Anewreferencestandardforcurrent-transformercalibra- tionsinindustry,"IEEE Trans.Instrum. Meas., vol.IM-13,pp. 107-114,1964. [61 Hartmann and Braun,KleinerkomplexerWechselstromkompen- sator,TypEWKW 1. [71H.J.Kohler,"Prazisions-Wechselspannungsverstarkermitgetrennt einstellbarerGleichspannungsverstiirkung,"PTB-Mitt.,vol.86,pp. 427-429,1976. [81K.Forger,"EinMefprinziphoherGenauigkeitfurUntersuchungen an Stromwandlern," dissertation, Tech. Univ. Braunschweig, Braunschweig,Germany,1953. New MethodforMeasurementof Electric-Field Distribution on Semiconductors SHIROSAKAI,MASUO FUKUI,TADAMITSU IRITANI,AND OSAMU TADA Abstract-New electric-fieldmeasuringequipmentwas con- structed. The electric-fielddistributionwas obtainedfrom po- tentialdistributionmeasuredbyasinglecapacitiveprobe through numericalcalculationbyamicrocomputer.Thesinglecapacitive probewasfabricatedwiththetechniqueofvacuumevaporation ofaluminum and SiO.The electric-fielddistribution under ac- oustoelectriccurrentoscillatedstateinCdSwas measured.The electric-fielddistributionmeasured bythepresentmethod was comparedwiththatobtainedbythetimederivativeofpotential....
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SemiE_field - IEEE TRANSACTIONS ON INSTRUMENTATION AND...

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