Exam1Spring2003 - dark image is an inclusion (basically a...

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~F ~D ~C ~B ~A
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The following is an actual EBIC image of a SiC material containing 2 types of defects that will reduce the minority carrier diffusion length, lowering the current collected in the measurements. The small dots are dislocations (missing rows of atoms) while the large
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Unformatted text preview: dark image is an inclusion (basically a trashed region of the crystal). The source of the current is from excess electron-hole pairs generated by a high energy electron beam (25 KV in this case) formed in a scanning electron microscope....
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This note was uploaded on 08/23/2011 for the course ECE 3040 taught by Professor Doolittle during the Spring '11 term at University of Florida.

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Exam1Spring2003 - dark image is an inclusion (basically a...

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