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Exam2Fall2009 - ,b t;50 ECE 3040 Microelectronic Circuits E...

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'+',}b" 't;5 0 ECE 3040 Microelectronic Circuits Exam 2 October 26, 2009 Dr. W. Alan Doolittle Print your name clearly and largely: t7 0 fa +1(; h.. "5 Instructions: Read all the problems carefully and thoroughly before you begin working. DO NOT REMOVE ANY PAGES FROM THIS EXAM. You are allowed to use 1 new sheet of notes {l page front and back), your note sheet from the previous exam as well as a calculator. There are 100 total points in this exam plus 10 points bonus (all or nothing grading). Observe the point value of each problem and allocate your time accordingly. SHOW ALL WORK AND CIRCLE YOUR FINAL ANSWER WITH THE PROPER UNITS INDICATED. Write legibly. If! cannot read it, it will be considered to be a wrong answer. Numeric answers without supporting work will be counted as wrong. Do all work on the paper provided. Tum in all scratch paper, even if it did not lead to an answer. Report any and all ethics violations to the instructor. Good luck! Sign your name on ONE of the two following cases: I DID NOT observe any ethical violations during this exam: I observed an ethical violation during this exam:
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First 20% True !False and Multiple Choice - Select the most correct answer(s) 1.) ([email protected] False: The diffusion capacitance ofajunction is due to minority carriers separated across the junction. 2.) (2-points~ False: Diode leakage current, 10, has two terms summed together. Each of the 0 terms come from minority carriers drifting (leaking) across the junction, so one term is from holes and one term is from electrons. 3.) (2-points) True ~Avalanche breakdown of a diode is always a destructive process that will'~ the diode if left uncorrected.
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