EE331LHBrev6 - EE-331 Devices and Circuits 1 Laboratory...

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R. B. Darling EE-331 Laboratory Handbook Page 1 EE-331 Devices and Circuits 1 Laboratory Handbook © Original: March 1993 Revision 1: Sept. 1993 Revision 2: Sept. 1994 Revision 3: Sept. 1996 by W. T. Dietze Revision 4: March 2000 Revision 5: Sept. 2004 Revision 6: Sept. 2005 Prof. Robert B. Darling Dept. of Electrical Engineering Box 352500 University of Washington Seattle, WA 98195-2500
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Organization, Hardware and Policies R. B. Darling EE-331 Laboratory Handbook Page 2 Contents page I. Organization, Hardware and Policies 1. Introduction 5 2. Calendar for the Quarter 6 3. Location and Time Slots 7 4. Laboratory Groups 7 5. Laboratory Grading 8 6. Electronic Instrumentation 9 7. Parts Kits 15 8. Replacement Parts 18 9. Laboratory Notebooks 18 10. How to Use the Experimental Procedures 19 11. Errata, Improvements, and Acknowledgements 20 II. The Experiments 0. Laboratory Preliminaries and Data Acquisition using LabVIEW (E0) P1. Transformer voltages E0.3 P2. Internal resistance of the lab transformer E0.5 P3. Create a curve tracer with your oscilloscope! E0.7 P4. Oscilloscope input resistance E0.9 P5. When is a wire not a wire? E0.10 P6. Temperature measurement using LabVIEW and a DAQ card E0.12 P7. Adding a Celsius to Fahrenheit conversion E0.17 P8. Saving the measurement results to spreadsheet files E0.18 1. 2-Terminal Device Characteristics and Diode Characterization (E1) P1. Measurement of diode reverse leakage current E1.2 P2. Measurement of diode forward turn-on voltage E1.4 P3. Measurement of diode I-V characteristics using the oscilloscopeE1.6 P4. Effect of series and parallel resistances E1.9 P5. Measurement of diode I-V characteristics using LabVIEW E1.11 P6. Measurement of a zener diode E1.16 P7. Characterization of a light-emitting diode (LED) E1.17 P8. Characterization of a photoconductive cell E1.18 P9. Diode switching transients E1.19 2. Diode Circuit Applications (E2) P1. Voltage clipper circuits E2.1 P2. Voltage limiter circuits E2.4 P3. Precision half-wave rectifier E2.6 P4. Half-wave rectifier and capacitive filtering E2.7 P5. Full-wave bridge rectifier and capacitive filtering E2.9
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Organization, Hardware and Policies R. B. Darling EE-331 Laboratory Handbook Page 3 P6. Zener diode voltage regulator E2.11 P7. Voltage clamper circuits E2.13 P8. Voltage multiplier circuits E2.14 3. JFET and MOSFET Characterization (E3) P1. Discrete MOSFET lead, sex, and mode identification E3.3 P2. Integrated MOSFET lead, sex, and mode identification E3.7 P3. Measurement of a MOSFET using a LabVIEW curve tracer E3.10 P4. Measurement of CMOS pairs using a LabVIEW curve tracer E3.15 P5. Output conductance effects E3.18 P6. JFET gate lead, sex, and mode identification E3.19 P7. Measurement of a JFET using a LabVIEW curve tracer E3.20 P8. JFET variable attenuator E3.22 4. FET Driver, Load, and Switch Circuits (E4) P1. E-mode MOSFET driver with resistor load E4.3 P2. E-mode MOSFET driver with D-mode load device E4.6 P3. D-mode JFET driver with resistor load E4.7 P4. CMOS inverter circuit E4.8 P5. CMOS Schmitt trigger circuit E4.9 P6. Create a VTC curve tracer using LabVIEW and a DAQ card E4.11 P7. CMOS inverter VTC measured using a LabVIEW curve tracerE4.17 P8. 3-input CMOS NAND gate E4.19 P9.
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This note was uploaded on 09/10/2011 for the course EE 331 taught by Professor Taicheng during the Winter '08 term at University of Washington.

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EE331LHBrev6 - EE-331 Devices and Circuits 1 Laboratory...

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