Jan. 10, 2006
ELEC7250: Course Organization
ELEC 7250 – VLSI Testing (Spring 2006)
Place and Time:
Broun 235, Tuesday/Thursday, 11:00AM—12:15PM
ELEC 7250. VLSI Testing (3) Lec. 3. Pr., ELEC 6770. Introduction to VLSI
testing, test process and automatic test equipment, test economics and product quality,
test economics, fault modeling, logic and fault simulation, testability measures,
combinational and sequential circuit test generation, memory test, analog test, delay test,
IDDQ test, design for testability, built-in self-test, boundary scan, analog test bus, system
test and core test.
Essentials of Electronic Testing for Digital, Memory & Mixed-Signal VLSI
Michael L. Bushnell and Vishwani D. Agrawal, Boston: Springer, 2006 printing
(this version has many corrections over the original (2000) and subsequent printings by
Kluwer Academic Publishers.)
Listed in Appendix C of the textbook.