lec8a - Lecture 8 Testability Measures s s s s Definition...

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Copyright 2001, Agrawa VLSI Test: Lecture 8alt 1 Lecture 8 Testability Measures Definition Controllability and observability SCOAP measures Combinational circuits Sequential circuits Summary
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Copyright 2001, Agrawa VLSI Test: Lecture 8alt 2 What are Testability Measures? Approximate measures of: Difficulty of setting internal circuit lines to 0 or 1 from primary inputs. Difficulty of observing internal circuit lines at primary outputs. Applications: Analysis of difficulty of testing internal circuit parts – redesign or add special test hardware. Guidance for algorithms computing test patterns – avoid using hard-to-control lines.
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Copyright 2001, Agrawa VLSI Test: Lecture 8alt 3 Testability Analysis Determines testability measures Involves Circuit Topological analysis, but no test vectors ( static analysis ) and no search algorithm. Linear computational complexity Otherwise, is pointless – might as well use automatic test-pattern generation and calculate: Exact fault coverage Exact test vectors
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Copyright 2001, Agrawa VLSI Test: Lecture 8alt 4 SCOAP Measures SCOAP – Sandia Controllability and Observability Analysis Program Combinational measures: CC0 – Difficulty of setting circuit line to logic 0 CC1 – Difficulty of setting circuit line to logic 1 CO – Difficulty of observing a circuit line Sequential measures – analogous: SC0 SC1 SO Ref.: L. H. Goldstein, “Controllability/Observability Analysis of Digital Circuits,” IEEE Trans. CAS, vol. CAS-26, no. 9. pp. 685 – 693, Sep. 1979.
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Copyright 2001, Agrawa VLSI Test: Lecture 8alt
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lec8a - Lecture 8 Testability Measures s s s s Definition...

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