lec15a - Lecture 15alt Memory NPSF and Parametric Test...

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Copyright 2005, Agrawa VLSI Test: Lecture 15alt 1 Definitions of NPSFs NPSF test algorithms Parametric tests Summary References Lecture 15alt Memory NPSF and Parametric Test (Alternative for Lecture 16)
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Copyright 2005, Agrawa VLSI Test: Lecture 15alt 2 Neighborhood Pattern Sensitive Faults Definitions: Neighborhood – Immediate cluster of k cells whose operation makes a base cell fail Base cell – A cell under test Deleted neighborhood – A neighborhood without the base cell ANPSF – Active NPSF APNPSF – Active and Passive NPSF PNPSF – Passive NPSF SNPSF – Static NPSF Assumption: Read operations are fault-free
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Copyright 2005, Agrawa VLSI Test: Lecture 15alt 3 Type-1 Active NPSF Active : Base cell changes when any one deleted neighborhood cell has a transition Condition for detection and location : Each base cell must be read in state 0 and state 1, for all possible deleted neighborhood pattern changes. Notation: C i,j < d 0 , d 1 , d 3 , d 4 ; b > Examples: ANPSF: C i,j < 0, ↓ , 1, 1; 0 > ANPSF: C i,j < 0, ↓ , 1, 1; ↕ > 2 1 0 3 4 2 – base cell 0, 1, 3 and 4 – deleted neighborhood cells k = 5
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Copyright 2005, Agrawa VLSI Test: Lecture 15alt 4 Type-2 Active NPSF Used when diagonal couplings are significant 4 – base cell 0, 1, 2, 3, 5, 6, 7 and 8 – deleted neighborhood cells 1 0 5 4 3 2 6 7 8 k = 9
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Copyright 2005, Agrawa VLSI Test: Lecture 15alt 5 Passive NPSF Passive NPSF : A certain neighborhood pattern prevents the base cell from changing. Condition for detection and location : Each base cell must be written and read in state 0 and in state 1, for all deleted neighborhood pattern changes. / 0 ( ↓ / 1 ) – Base cell fault effect indicating that base cannot change
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Copyright 2005, Agrawa VLSI Test: Lecture 15alt 6 Static NPSF Static NPSF : Base cell forced into a particular state when deleted neighborhood contains particular pattern. Differs from active – need not have a transition to sensitize an SNPSF Condition for detection and location : Apply all 0 and 1 combinations to k -cell neighborhood, and verify that each base cell was written with a 1 and a 0. Examples: C i,j < 0, 1, 0, 1; - / 0 > means that base cell forced to 0 C i,j < 0, 1, 0, 1; - / 1 > means that base cell forced to 1
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Copyright 2005, Agrawa VLSI Test: Lecture 15alt 7 NPSF Fault Detection and Location Algorithm 1.
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This note was uploaded on 09/16/2011 for the course ELEC 7250 taught by Professor Agrawal during the Summer '11 term at Auburn University.

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lec15a - Lecture 15alt Memory NPSF and Parametric Test...

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