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Thesis_Alok - Independence Fault Collapsing and Concurrent...

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Independence Fault Collapsing and Concurrent Test Generation Except where reference is made to the work of others, the work described in this thesis is my own or was done in collaboration with my advisory committee. This thesis does not include proprietary or classified information. Alok Shreekant Doshi Certificate of Approval: Victor P. Nelson Professor Electrical and Computer Engineering Vishwani D. Agrawal, Chair James J. Danaher Professor Electrical and Computer Engineering Charles E. Stroud Professor Electrical and Computer Engineering Stephen L. McFarland Acting Dean Graduate School
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Independence Fault Collapsing and Concurrent Test Generation Alok Shreekant Doshi A Thesis Submitted to the Graduate Faculty of Auburn University in Partial Fulfillment of the Requirements for the Degree of Master of Science Auburn, Alabama May 11, 2006
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Independence Fault Collapsing and Concurrent Test Generation Alok Shreekant Doshi Permission is granted to Auburn University to make copies of this thesis at its discretion, upon the request of individuals or institutions and at their expense. The author reserves all publication rights. Signature of Author Date of Graduation iii
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Vita Alok S. Doshi, son of Mrs. Rohini Doshi and Mr. Shreekant M. Doshi, was born in Pune, Maharashtra, India. He graduated from Fergusson College, Pune in 1999. He earned the degree Bachelor of Engineering in Electronics and Telecommunication from Maharashtra Institute of Technology affiliated to Pune University, Pune, India in 2003. iv
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Thesis Abstract Independence Fault Collapsing and Concurrent Test Generation Alok Shreekant Doshi Master of Science, May 11, 2006 (B.E., Pune University, 2003) 99 Typed Pages Directed by Vishwani D. Agrawal The objective of this work is to find suitable targets for Automatic Test Pattern Generation (ATPG) such that a minimal test set is obtained for a combinational circuit. Original concepts of independence fault collapsing and concurrent test gen- eration are developed and a novel test generation strategy based on these is devised. Independence fault collapsing groups faults into independent fault subsets such that each subset includes some faults that cannot be covered by the tests derived for any other subset. Using these fault subsets, optimally compact tests can be found. For an equivalence or dominance collapsed fault set an independence graph is gen- erated using structural and functional independences. Each fault is represented as a node and an undirected edge between two nodes indicates independence of the corre- sponding faults; two independent faults cannot be detected by the same test vector. A “similarity-based” collapsing procedure reduces the graph to a fully-connected graph, whose nodes specify concurrently-testable fault targets for the ATPG.
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