lec1_adVLSI

lec1_adVLSI - ELEC 7770 Advanced VLSI Design Spring 2010...

Info iconThis preview shows page 1. Sign up to view the full content.

View Full Document Right Arrow Icon
This is the end of the preview. Sign up to access the rest of the document.

Unformatted text preview: ELEC 7770 Advanced VLSI Design Spring 2010 Introduction Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr10 Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 1 Related Course: VLSI Design ELEC 5770/6770: Review of MOS transistor fundamentals, CMOS logic circuits; VLSI fabrication and design rules; clocking strategies and sequential design; performance estimation; memories and programmable arrays; standard cell design methodologies; computer aided design (CAD) tools. Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 2 Related Course: Computer-Aided Related Design of Digital Circuits Design ELEC 5250/6250: Hardware components of multiprocessor systems including processor, interconnection, memory, and control architectures; Software elements of parallel processing including inter-processor communication, task partitioning, task mapping and scheduling, load balancing, programming languages, and parallel algorithms. Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 3 Related Course: Low-Power Design of Related Electronic Circuits Electronic ELEC 5270/6270: Design of digital circuits and systems for reduced power consumption, power analysis algorithms, low-power MOS technologies, low-power design architectures for FPGA, memory and microprocessor, reduction of power in testing of circuits. Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 4 Related Course: VLSI Testing ELEC 7250: Introduction to VLSI testing, test process and automatic test equipment, test economics and product quality, fault modeling, logic and fault simulation, testability measures, combinational and sequential circuit test generation, memory test, analog test, delay test, IDDQ test, design for testability, built-in self-test, boundary scan, analog test bus, system test and core test. Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 5 Related Course: Digital System Design ELEC 4200: Hierarchical, modular design of digital systems; computer-aided digital system modeling, simulation, analysis, and synthesis; design implementation with programmable logic devices and field programmable gate arrays. Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 6 This Course: Advanced VLSI Design ELEC 7770: Review of CMOS logic circuits; ELEC impact of fabrication issues on design; high speed switching circuits; high performance memory structures; advanced clocking strategies and clock distribution; performance optimization; deep submicron design issues; ASIC design flow: logic synthesis, placement and routing; design verification; low power design. Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 7 Course Objectives and Evaluation Objectives: Learn and participate in the process of modern VLSI Learn design, verification, and test of a chip. design, Develop an understanding for the advanced design Develop concepts in modern VLSI technologies. concepts Evaluation: Project Homeworks Final exam, May 7, 2010, B102, 4-6:30PM Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 35% 30% 35% 8 Course Outline Design Project Advanced Topics Economics of VLSI systems Logic synthesis and technology mapping Retiming and timing optimization Soft errors and fault tolerance Signal integrity Verification Fault diagnosis Technologies of the future (reading assignments) Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 9 Reference Books J. M. Rabaey, A. Chandrakasan, and B. Nikolić, ć, Digital Integrated Circuits, A Design Perspective, Second Edition, Prentice-Hall, 2003. Second M. J. S. Smith, Application-Specific Integrated M. Circuits, Addison-Wesley, 1997. Circuits N. H. E. Weste and D. Harris, CMOS VLSI N. Design, A Circuits and Systems Perspective, Third Edition, Addison-Wesley, 2005. Third W. Wolf, Modern VLSI Design, System-on-Chip W. Design, Third Edition, Prentice-Hall, 2002. Design, Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 10 VLSI Realization Process Customer’s need Design Determine requirements Write specifications Design synthesis and Verification Test development Fabrication Manufacture Manufacturing test Chips to customer Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 11 Defining Terms Design synthesis: Given an I/O function, develop a Design procedure to manufacture a device using known materials and processes. materials Verification: Predictive analysis to ensure that the Verification: synthesized design, when manufactured, will perform the given I/O function. perform Test: Characterization: A test that debugs test program by fault Characterization: diagnosis. diagnosis. Manufacturing test: A step that ensures that the physical Manufacturing device, manufactured from the synthesized design, has no manufacturing defect. no Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 12 VLSI Design & Test Seminar Series Must attend http://www.eng.auburn.edu/users/strouce/D&TSem Every Wednesday, Broun 235, 4PM Spring 10, Jan 11 Spring ELEC 7770: Advanced VLSI Design (Agrawal) 13 ...
View Full Document

Ask a homework question - tutors are online