3GBIST - Built­In Self­Test Built­In Self­Test for...

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Unformatted text preview: Built­In Self­Test Built­In Self­Test for 3rd­Generation Mobile Users John Sunwoo Electrical and Computer Engineering Department Auburn University , AL Smart Phones ► Download mp3 files and listen. ► Online shopping ► Online gaming ► GPS ► Mobile pay ► Wireless Key ► Start the car 2 Paying School Tuition Are you sure you are paying $5,000, not $50,000? 3 Near future 4 Objective ► Extensive usage of data transmissions via mobile devices Tx/Rx of critical data ► Make sure your mobile phone has no fault Users need to have access to high­ level functional test The testing operation should be easy ► BIST for users 5 History of mobile communications ­ 2G has limited data capability 6 Cellular network ­ Base station is located each cell ­ Base station has physical connection to phone/data line ­ One user connect to other users via base stations 7 TDMA vs CDMA ► TDMA: Time Division Multiple Access Allows a number of users to access RF channel without interference by allocating unique time slots to each user within each channel ► CDMA: Code Division Multiple Access Every communicator will be allocated the entire channel all the time by having different code than the others 8 2G to 3G… Test challenges? ► 3G testing are related to the fact that it is fundamentally different than testing 2G networks ► Adjustment with just a power meter. (2G) ► Scan multiple neighboring base stations for interference that may affect network performance. (3G) 9 Case Study 10 Model ► Samsung SPH­I500 PDA Phone ► $500 ~ $600 ► CDMA 800Mhz/1900Mhz ► Built­in memory 32MB 11 USB Interface 12 Inside ► ► ► CDMA Processor Base band­to­radio frequency transmit processor IF­to­base band processor 13 My BIST Approach ► Test control: Via USB ► TPG: CDMA processor ► ORA: CDMA processor ► DUT: Transceiver circuitry RFT3100 ­> Power amplifier ­> RFR3300 ­> IFR3300 14 Plan BIST START TPG & ORA ­BIST start ­No need of additional hardware within certain assumptions. (Making assumptions means the design is could be very vague) ­Is it an effective test? (Diagnostic resolution) 15 How did others tested RF device? ► Dr. Chatterjee Test point insertion algorithm for determining the best nodes for sensor insertion Sensors outputs can predict system and module specifications Area overhead < 15% 16 Dr. Dabrowski (Sweden) 17 Drawbacks ► John have never took RF classes. (Major) ► Qualcomm never responds my email for asking the actual data sheet of the MSM5100 modem. 18 Conclusions ► The applicability of the presented BIST has only for the higher­level model Mainly useful for hard faults such as spot defects rather than parametric faults. Only applicable in a stable production process or after the production. ► Exactly what consumer want 19 Good and Bad ► Avoids affecting the internal RF parts to noise or external disturbances. ► Fault diagnosis is not possible. 20 Future work ► Bluetooth Testing 2.4GHz No published paper on Bluetooth BIST 21 ...
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This note was uploaded on 09/17/2011 for the course ELEC 6970 taught by Professor Staff during the Spring '08 term at Auburn University.

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