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Unformatted text preview: BuiltIn SelfTest BuiltIn SelfTest for 3rdGeneration Mobile Users
Electrical and Computer Engineering Department
, AL Smart Phones
► Download mp3 files and listen.
► Online shopping
► Online gaming
► Mobile pay
► Wireless Key
► Start the car
2 Paying School Tuition Are you sure you are paying $5,000, not $50,000? 3 Near future 4 Objective
► Extensive usage of data transmissions via mobile devices Tx/Rx of critical data ► Make sure your mobile phone has no fault Users need to have access to high
level functional test The testing operation should be easy
► BIST for users 5 History of mobile communications 2G has limited data capability 6 Cellular network Base station is located each cell
Base station has physical connection to phone/data line
One user connect to other users via base stations 7 TDMA vs CDMA
► TDMA: Time Division Multiple Access Allows a number of users to access RF channel without interference by allocating unique time slots to each user within each channel
► CDMA: Code Division Multiple Access Every communicator will be allocated the entire channel all the time by having different code than the others
8 2G to 3G… Test challenges?
► 3G testing are related to the fact that it is fundamentally different than testing 2G networks
► Adjustment with just a power meter. (2G)
► Scan multiple neighboring base stations for interference that may affect network performance. (3G)
9 Case Study 10 Model
► Samsung SPHI500 PDA Phone
► $500 ~ $600
► CDMA 800Mhz/1900Mhz
► Builtin memory 32MB 11 USB Interface 12 Inside ►
► CDMA Processor
Base bandtoradio frequency transmit processor
IFtobase band processor 13 My BIST Approach
► Test control: Via USB
► TPG: CDMA processor
► ORA: CDMA processor
► DUT: Transceiver circuitry RFT3100 > Power amplifier > RFR3300 > IFR3300 14 Plan
START TPG &
ORA BIST start
No need of additional hardware within certain assumptions. (Making assumptions means the
design is could be very vague)
Is it an effective test? (Diagnostic resolution) 15 How did others tested RF device?
► Dr. Chatterjee Test point insertion algorithm for determining the best nodes for sensor insertion Sensors outputs can predict system and module specifications Area overhead < 15% 16 Dr. Dabrowski (Sweden) 17 Drawbacks
► John have never took RF classes. (Major)
► Qualcomm never responds my email for asking the actual data sheet of the MSM5100 modem. 18 Conclusions
► The applicability of the presented BIST has only for the higherlevel model Mainly useful for hard faults such as spot defects rather than parametric faults. Only applicable in a stable production process or after the production. ► Exactly what consumer want 19 Good and Bad
► Avoids affecting the internal RF parts to noise or external disturbances.
► Fault diagnosis is not possible. 20 Future work
► Bluetooth Testing 2.4GHz
No published paper on Bluetooth BIST 21 ...
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This note was uploaded on 09/17/2011 for the course ELEC 6970 taught by Professor Staff during the Spring '08 term at Auburn University.
- Spring '08